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resolution field emission jeol jsm 7500f sem  (JEOL)


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    JEOL resolution field emission jeol jsm 7500f sem
    Resolution Field Emission Jeol Jsm 7500f Sem, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 12961 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/resolution+field+emission+jeol+jsm+7500f+sem/JSM-7500F+Scanning+Electron+Microscope/pmc12884642-129-22-24
    Average 97 stars, based on 12961 article reviews
    resolution field emission jeol jsm 7500f sem - by Bioz Stars, 2026-10
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    JEOL high resolution field emission scanning electron microscope jeol jsm-7500f sem
    Deletion of the ClbP gene in pks + E. coli strain IHE3034. (A) PCR confirmation of clbP deletion. 1kb DNA standars, (2 and 3) PCR Blank (4 and 5) E. coli IHE3034 pks+ (6 to 9) E. coli IHE3034 Δ clbP (10 and 11) E. coli DH10B pks − . B) Giemsa staining of HeLa cell line after 72 hours of post-infection with IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B (negative control) E. coli strains at 37 °C and 5 % CO 2 . Bacterial infection was for 4 hours at 37 °C and 5 % CO 2 . All optical <t>microscope</t> images were taken at 40X. C) Growth Curve of IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B E. coli strains at 37 °C under constant shaking.
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    JEOL sem imaging jeol jsm-7500f ultra high resolution field emission scanning electron microscope (fe-sem)
    Deletion of the ClbP gene in pks + E. coli strain IHE3034. (A) PCR confirmation of clbP deletion. 1kb DNA standars, (2 and 3) PCR Blank (4 and 5) E. coli IHE3034 pks+ (6 to 9) E. coli IHE3034 Δ clbP (10 and 11) E. coli DH10B pks − . B) Giemsa staining of HeLa cell line after 72 hours of post-infection with IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B (negative control) E. coli strains at 37 °C and 5 % CO 2 . Bacterial infection was for 4 hours at 37 °C and 5 % CO 2 . All optical <t>microscope</t> images were taken at 40X. C) Growth Curve of IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B E. coli strains at 37 °C under constant shaking.
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    JEOL resolution field emission jeol jsm 170 7500f sem
    Deletion of the ClbP gene in pks + E. coli strain IHE3034. (A) PCR confirmation of clbP deletion. 1kb DNA standars, (2 and 3) PCR Blank (4 and 5) E. coli IHE3034 pks+ (6 to 9) E. coli IHE3034 Δ clbP (10 and 11) E. coli DH10B pks − . B) Giemsa staining of HeLa cell line after 72 hours of post-infection with IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B (negative control) E. coli strains at 37 °C and 5 % CO 2 . Bacterial infection was for 4 hours at 37 °C and 5 % CO 2 . All optical <t>microscope</t> images were taken at 40X. C) Growth Curve of IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B E. coli strains at 37 °C under constant shaking.
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    Deletion of the ClbP gene in pks + E. coli strain IHE3034. (A) PCR confirmation of clbP deletion. 1kb DNA standars, (2 and 3) PCR Blank (4 and 5) E. coli IHE3034 pks+ (6 to 9) E. coli IHE3034 Δ clbP (10 and 11) E. coli DH10B pks − . B) Giemsa staining of HeLa cell line after 72 hours of post-infection with IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B (negative control) E. coli strains at 37 °C and 5 % CO 2 . Bacterial infection was for 4 hours at 37 °C and 5 % CO 2 . All optical microscope images were taken at 40X. C) Growth Curve of IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B E. coli strains at 37 °C under constant shaking.

    Journal: bioRxiv

    Article Title: The accumulation of colibactin intermediates does not affect the growth and morphology of pks + Escherichia coli

    doi: 10.1101/2020.04.17.047712

    Figure Lengend Snippet: Deletion of the ClbP gene in pks + E. coli strain IHE3034. (A) PCR confirmation of clbP deletion. 1kb DNA standars, (2 and 3) PCR Blank (4 and 5) E. coli IHE3034 pks+ (6 to 9) E. coli IHE3034 Δ clbP (10 and 11) E. coli DH10B pks − . B) Giemsa staining of HeLa cell line after 72 hours of post-infection with IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B (negative control) E. coli strains at 37 °C and 5 % CO 2 . Bacterial infection was for 4 hours at 37 °C and 5 % CO 2 . All optical microscope images were taken at 40X. C) Growth Curve of IHE3034 (pks + ), IHE3034 (Δ clbP ) and DH10B E. coli strains at 37 °C under constant shaking.

    Article Snippet: SEM analysis was performed with the high resolution field emission scanning electron microscope (JEOL JSM-7500F SEM), using 1 kV acceleration voltage for a gentle electron beam.

    Techniques: Staining, Infection, Negative Control, Microscopy